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- Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization - Fred Stevie
Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization
Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization
This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.
PRP: 495.69 Lei
Acesta este Prețul Recomandat de Producător. Prețul de vânzare al produsului este afișat mai jos.
446.12Lei
446.12Lei
495.69 LeiPrimești 446 puncte
Livrare in 2-4 saptamani
Descrierea produsului
This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.
Detaliile produsului
