Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization
De (autor): Fred Stevie

Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization
De (autor): Fred Stevie
This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.
-10%
transport gratuit
PRP: 495.69 Lei

Acesta este Pretul Recomandat de Producator. Pretul de vanzare al produsului este afisat mai jos.
446.12Lei
446.12Lei
495.69 LeiPrimesti 446 puncte

Primesti puncte de fidelitate dupa fiecare comanda! 100 puncte de fidelitate reprezinta 1 leu. Foloseste-le la viitoarele achizitii!
Livrare in 2-4 saptamani
X
Pentru a putea comanda rapid este nevoie sa introduceti numarul dvs de telefon in formatul 0xxxxxxxxx (10 cifre).Un operator Libris.ro va suna si va cere telefonic restul datelor necesare.
Descrierea produsului
This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.
Detaliile produsului
S-ar putea sa-ti placa si
-
-10%
transport gratuit
Structure of Materials: An Introduction to Crystallography, Diffraction and Symmetry - Marc De Graef
PRP: 571.11 Lei
514.00 Lei
514.00 Lei571.11 Lei
Parerea ta e inspiratie pentru comunitatea Libris!